Velox新軟件發(fā)布-3.2.1增強(qiáng)版

In February of this year, we published a post that highlighted the new Velox? 3.2 probe station control software features. We are excited to deliver the latest Velox 3.2.1 that introduces some additional features and benefits.

Here are some highlights:

• AugmentedAlign Tool: Improves RF, mmW and THz measurement accuracy and simplifies probe positioning
• Find Feature Tool: Pattern recognition-based dimensional feedback of probe position with μm resolution
• Live Vision with Analytical Tools: Maximum ergonomics with Measure On-Screen and Snap Image
• Python-based Scripting Console: Allows user code for control of WinCal, VNA and more

• Near-on-axis technology: high thermal stability with small station footprint
• Measurements over temperature with optional RF/DC cover: EMI-shielded, dark and frost-free
• Modular design: interchangeable with other application layers, (i.e. RF TopHat)
• Full wafer Z-profiling
• Single die alignment without a microscope